2007-2008 UNIVERSITY CATALOGUE

MSCI - Materials Science

301 Introduction to Materials Characterization: Scanning Electron Microscopy
1 cr (1-2). Sp.
Not for GE
Cross-listed with PHYS 301
P: PHYS 211 or 231, and one science course that counts
toward a science major
Credit may not be earned in both PHYS 301 and MSCI 301
Current theories and methods in scanning electron microscopy and energy dispersive x-ray spectroscopy. Preparation of samples, operation of scanning electron microscopes and data analysis.

302 Introduction to Materials Characterization: X-ray Photoelectron Spectroscopy
1 cr (1-2). Sp.
Not for GE
Cross-listed with PHYS 302
P: PHYS 211 or 231, and one science course that counts
toward a science major
Credit may not be earned in both PHYS 302 and MSCI 302
Current theories and methods in x-ray photoelectrons spectroscopy. Sample preparation, operation and data analysis.

303 Introduction to Materials Characterization: X-ray Diffraction
1 cr (1-2). Sp.
Not for GE
Cross-listed with PHYS 303
P: PHYS 211 or 231, and one science course that counts
toward a science major
Credit may not be earned in both PHYS 303 and MSCI 303
Current theories and methods in x-ray diffraction. Sample preparation, operation and data analysis.

304 Introduction to Materials Characterization: Atomic Force Microscopy
1 cr (1-2). Sp.
Not for GE
Cross-listed with PHYS 304
P: PHYS 211 or 231, and one science course that counts
toward a science major
Credit may not be earned in both PHYS 304 and MSCI 304
Current theories and methods in Atomic Force Microscopy. Sample preparation, operation of atomic force microscope and data analysis.

305 Introduction to Materials Characterization: X-ray Fluorescence
1 cr (1-2). Sp.
Not for GE
Cross-listed with PHYS 305
P: PHYS 211 or 231, and one science course that counts
toward a science major
Credit may not be earned in both PHYS 305 and MSCI 305
Current theories and methods in x-ray Florescence Spectroscopy. Preparation of samples, operation of x-ray spectrometers and data analysis.

306 Introduction to Materials Characterization: Transmission Electron Microscopy
1 cr (1-2). Sp.
Not for GE
Cross-listed with PHYS 306
P: PHYS 211 or 231; PHYS/MSCI 301 and 303
Credit may not be earned in both PHYS 306 and MSCI 306
Current theories and methods in transmission electron microscopy. Sample preparation, operation and data analysis.

307 Introduction to Materials Characterization: Nanoindentation
1 cr (1-2). Sp.
Not for GE
Cross-listed with PHYS 307
P: PHYS 211 or 231, and one science course that counts
toward a science major
Credit may not be earned in both PHYS 307 and MSCI 307
Current theories and methods in nanoindentation analysis. Sample preparation, operation and data analysis.

310 Introduction to Nanoscience
3 crs (3-0). F, Wi, Sp, Su.
GE-IIF
Fundamentals of how material behavior, properties and function change due to small size. Applications in science and industry and nanotechnology products. Environmental, social, and ethical implications.