Materials Science Center Instrumentation
A poster outlining Materials Science Center instrumentation is available.
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video about Materials Science Center instrumentation.
The ThermoFinnigan Element2 HR-ICP-MS is used to conduct ultratrace level analyses on samples as diverse as steel and body fluids. One of less than 500 worldwide, this powerful instrument is commonly used for geological studies and water analysis. MSC staff has also studied plastics and catalysts for private sector partners using ICP-MS. Most metals can be detected to the parts per trillion (ppt) level, including many that are often obscured in quadrupole ICP-MS work. The multi-element capabilities of the instrument enable rapid quantitative analysis. SEM/EDS - Scanning Electron Microscopy with Energy Dispersive Analysis
The Hitachi S510 SEM is equipped with a ThermoNoran EDS detector and System Six software. The instrument is used for studies of surface morphology and bulk elemental analysis and mapping of samples such as electronic components. Images and data are easily captured by the software for rapid distribution via e-mail. MSC staff has worked with regional businesses to study defects in machined parts and the elemental makeup/distribution of alloys. TEM - Transmission Electron Microscopy
The JEOL 2010 200 kV TEM provides high resolution nanoscale images of materials and electron diffraction patterns, which provide crystallographic information. The TEM is capable of magnification up to 1 million times, providing spatial resolution of 1-10 nm. AFM - Atomic Force Microscopy
The Asylum Research MFP-3D SA conducts three dimensional measurements on the nanoscale. The microscope is equipped with temperature controls for sample heating. The AFM can image samples in liquid environments as well as in air, making this a powerful tool in research areas including materials science and life science. XPS - X-Ray Photoelectron Spectroscopy
XPS (also called ESCA - Electron Spectroscopy for Chemical Analysis) is a surface sensitive technique that provides elemental and chemical analysis. Depth resolution of 1-10 nm is possible. Organic functional groups can be identified as well as very thin surface layer structures and material interfaces. XRF - X-Ray Fluorescence Spectroscopy
The Siemens SRS3000 XRF instrument can identify major and minor elements to the ppm level in a variety of samples. Quantification is obtained with matrix matched standards. Common samples include rocks, sand, and glasses. Handheld XRF
The Thermo Niton XL3t 900S GOLDD handheld XRF is a portable device used to quickly determine the elemental composition of a sample. This analysis tool can identify most alloys in under 30 seconds. It is also used in consumer product safety applications, import/export restrictions, precious metal identification, soil monitoring, QA/QC work, antiquities research, and to check for RoHS/WEEE/CPSIA compliance. Minimal sample preparation also makes this non-destructive technique attractive in screening items. FT-IR - Fourier Transform Infrared Spectroscopy
The Materials Science Center has access to several FTIR instruments, including those with diffuse reflectance (DRIFTS) and attenuated total reflectance (ATR) capabilities. Spectral libraries allow for molecular identification. A Micro-FTIR instrument is available for the analysis of small regions in a sample.
