Materials Science Center Instrumentation

HR-ICP-MS – High Resolution - Inductively Coupled Plasma - Mass Spectrometry
The ThermoFinnigan Element2 HR-ICP-MS is used to conduct ultratrace level analyses on samples as diverse as steel and body fluids. This powerful instrument is commonly used for geological studies and water analysis. MSC staff have also studied plastics and peptides for private industry using ICP-MS. Most metals can be detected to the parts per trillion (ppt) level, including many that are often obscured in quadrupole ICP-MS work. The multi-element capabilities of the instrument enable rapid quantitative analysis.

SEM/EDS – Scanning Electron Microscopy with Energy Dispersive Analysis
The Hitachi S510 SEM is equipped with a ThermoNoran EDS detector and System Six software. The instrument is used for studies of surface morphology and bulk elemental analysis and mapping of samples such as electronic components. Images and data are easily captured by the software for rapid distribution via e-mail. MSC staff have worked with regional businesses to study defects in machined parts and the elemental makeup/distribution of alloys.

TEM – Transmission Electron Microscopy
The JEOL 2010 200 keV TEM provides high resolution nanoscale images of materials and electron diffraction patterns, which provide crystallographic information. The TEM is capable of magnification up to 1 million times, providing spatial resolution of 1-10 nm.

XPS – X-Ray Photoelectron Spectroscopy
XPS (also called ESCA – Electron Spectroscopy for Chemical Analysis) is a surface sensitive technique that provides elemental and chemical analysis. Depth resolution of 1-10 nm is possible. Organic functional groups can be identified as well as very thin surface layer structures and material interfaces.

XRF – X-Ray Fluorescence Spectroscopy
The Siemens SRS3000 XRF instrument can identify major and minor elements to the ppm level in a variety of samples. Quantification is obtained with matrix matched standards.

FT-IR – Fourier Transform Infrared Spectroscopy
The Materials Science Center has access to several FTIR instruments, including those with diffuse reflectance (DRIFTS) and attenuated total reflectance (ATR) capabilities. Spectral libraries allow for molecular identification. A Micro-FTIR instrument is available for the analysis of small regions in a sample.

A poster outlining Materials Science Center instrumentation is available.
Click here for a video about Materials Science Center instrumentation.