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Instrumentation in Materials Science 



X-ray Photoelectron Spectrometer

X-Ray Photoelectron Spectrometer

sssd Phoibos-150 hemispherical analyzer, dual anode (Al/Mg) X-ray source, and load-lock chamber.

X-Ray Photoelectron Spectrometer


Professor using the ThermoFinnigan Element2 HR-ICP-Mass Spectrometer

ThermoFinnigan Element2
HR-ICP-Mass Spectrometer

This instrument is used to conduct ultratrace level analyses on samples as diverse as steel and body fluids. This powerful instrument is commonly used for geological studies and water analysis. Most metals can be detected to the parts per trillion (ppt) level, including many that are often obscured in quadrupole ICP-MS work. The multi-element capabilities of the instrument enable rapid quantitative analysis.



Professor showing student how to use Asylum Research MFP-3D SA Atomic Force Microscope

Asylum Research MFP-3D SA
Atomic Force Microscope

This instrument conducts three dimensional measurements on the nanoscale. The microscope is equipped with temperature controls for sample heating. The AFM can image samples in liquid environments as well as in air, making this a powerful tool in research areas including materials science and life science.

Professor showing student how to use Asylum Research MFP-3D SA Atomic Force Microscope


Perkin-Elmer LS-55 Spectrofluorometer

This instrument is equipped with a single-cell Peltier cooler ( sample temperature from 0-100 °C) and is capable of measuring fluorescence, phosphorescence, and chemiluminescence from 200 to 900 nm and excitation spectra from 200 to 800 nm.

Perkin-Elmer LS-55 Spectrofluorometer



Students using a EOL 2010 200 kV Transmission Electron Microscope

JEOL 2010 200 kV
Transmission Electron Microscope

This instrument provides high resolution nanoscale images of materials and electron diffraction patterns, which provide crystallographic information. The TEM is capable of magnification up to 1 million times, providing spatial resolution of 1-10 nm..

EOL 2010 200 kV Transmission Electron Microscope


Student working on a Physical Electronics PHI 680 Scanning Auger Nanoprobe

Physical Electronics PHI 680
Scanning Auger Nanoprobe

This instrument uses Auger Electron Spectroscopy (AES) to determine the elemental content of the first few atomic layers of a sample. It is also equipped with a scanning electron microscope and ion sputtering capabilities, allowing for depth profiling of samples.

Student working on a Physical Electronics PHI 680 Scanning Auger Nanoprobe


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